Chen T, Pan Y D. A novel diagnostic method for multiple open-circuit faults of voltage-source inverters based on output line voltage residuals analysis [J]. IEEE Transactions on Circuits and Systems II: Express Briefs, 2021, 68(4): 1343-1347

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Next One:Chen T, Pan Y D, Xiong Z B. Fault diagnosis scheme for single and simultaneous open-circuit faults of voltage-source inverters on the basis of fault online simulation [J]. Journal of Power Electronics, 2021, 21(2): 384-395