|
CHEN Zhehan. A digital metrology process model (MPM) for measuring planning and data analysis and its application with a computer aided system. The International Journal of Advanced Manufacturing Technology. 2017, 92: 1967-1977
点击次数：
是否译文：否
上一条：CHEN Zhehan, Zong Xianhui*, Shi Jing and Zhang Xiaohua. Online monitoring based on temperature field features and prediction model for selective laser sintering process. Applied Science-basel. 2018, 8(12): 2383-2398
下一条：CHEN Zhehan，DU Fuzhou*，TANG Xiaoqing，Position & Orientation best-fitting based on deterministic theory during large scale assembly. Journal of Intelligent Manufacturing. 2018, 29(4): 827-837