Qiulin
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- Professional Title:Professor
Supervisor of Doctorate Candidates
Alma Mater:Graguate School of Chinese Academy of Sciences
Discipline:Thermal Engineering
School/Department:School of Energy and Environmental Engineering
Business Address:Office 1107, Jidian Building, University of Science and Technology Beijing

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- Patents
- Xinghua Zheng, Peng Yue, Yuhua Li, Lin Qiu, Dawei Tang, “Antigravity Spiral Coiled Pipe Type Non-phase-change Heat Removal Device” - C.N. Patent 201420237565.7, Awarded 2014/9/24.
- Lin Qiu, Xianfeng Xu, Dawei Tang, Jie Zhu, Wenfeng Bu, “Optical System and Method for Measuring Thermal Physical Property Parameters of Solid” - C.N. Patent 201210476747.5, Awarded 2014/8/20. (Invention)
- Lin Qiu, Xinghua Zheng, Dawei Tang, “Measurement Device and Measurement Method of Veneer-type Sensor for Measuring Heat Absorption Coefficient” - C.N. Patent 201210258346.2, Awarded 2014/4/9. (Invention)
- Lin Qiu, Gang Wang, Xinghua Zheng, Dawei Tang, “Software for the measurement of thermophysical properties parameters for liquids and powders (Version No. 1.0.0)” - C.N. Computer Software Copyright 2014R11S010727, Awarded 2014/3/1.
- Xinghua Zheng, Guoping Su, Dawei Tang, Lin Qiu, “Detection Method for Thermal Conductivity and Thermal Diffusivity of Anisotropic Material” - C.N. Patent 201010201486.7, Awarded 2013/5/8. (Invention)
- Xinghua Zheng, Lin Qiu, Dawei Tang, “Device and Method for Measuring Heat Storage Coefficient of Material by Harmonic Method Based on Independent Sensor” - C.N Patent 201110138899.X, Awarded 2013/2/13. (Invention)
- Lin Qiu, Xinghua Zheng, Dawei Tang, “Surface-mounted Sensor and Heat Absorption Coefficient Measuring Device” - C.N. Patent 201220360421.1, Awarded 2013/2/13.
- Xinghua Zheng, Lin Qiu, Guoping Su, Dawei Tang, “Method and Device for Testing Thermal Physical Property of Single Conductive Filamentary Material by Using Harmonic Method” - C.N. Patent 201010141035.9, Awarded 2012/10/31. (Invention)
- Xinghua Zheng, Lin Qiu, Guoping Su, Dawei Tang, “Harmonic Micrometer/Nanometre Film Thermal Property Test Method” - C.N. Patent 201010218390.1, Awarded 2012/6/27. (Invention)
- Xinghua Zheng, Lin Qiu, Dawei Tang, “Method and Device for Testing Thermal Physical Property of Solid Material with Independent Probe by Using Harmonic Method” - C.N. Patent 200910242362.0, Awarded 2011/10/5. (Invention)