Liang Ma, Mengwei Wang, Kaixiang Peng. A missing manufacturing process data imputation framework for nonlinear dynamic soft sensor modeling and its application. Expert Systems with Applications, 2024, 237, 121428.

Liang Ma, Mengwei Wang, Kaixiang Peng. Nonlinear dynamic Granger causality analysis framework for root-cause diagnosis of quality-related faults in manufacturing processes. IEEE Transactions on Automation Science and Engineering, 2023, doi: 10.1109/TASE.2023.3281330.

Liang Ma, Mengwei Wang, Kaixiang Peng. Bidirectional minimal gated unit-based nonlinear dynamic soft sensor modeling framework for quality prediction in process industries. IEEE Transactions on Instrumentation and Measurement, 2023, 72: 3513109.

马亮, 彭开香, 董洁. 工业过程故障根源诊断与传播路径识别技术综述. 自动化学报, 2022, 48(7): 1650-1663.

Liang Ma, Mengwei Wang, Kaixiang Peng. A two-phase soft sensor modeling framework for quality prediction in industrial processes with missing data. Journal of Process Control, 2023, 129: 103061.

Liang Ma, Jie Dong, Kaixiang Peng. A practical root cause diagnosis framework for quality-related faults in manufacturing processes with irregular sampling measurements. IEEE Transactions on Instrumentation and Measurement, 2022, 71: 3511509.

Liang Ma, Mengwei Wang, Kaixiang Peng. A novel bidirectional gated recurrent unit-based soft sensor modeling framework for quality prediction in manufacturing processes. IEEE Sensors Journal, 2022, 22(19): 18610-18619.

Liang Ma, Jie Dong, Kaixiang Peng. A novel multi-label classification framework for coupling faults in hot rolling processes. IEEE Transactions on Control Systems Technology, 2022, 30(2): 877-884.

Liang Ma, Jie Dong, Kaixiang Peng. A novel robust semisupervised classification framework for quality-related coupling faults in manufacturing industries. IEEE Transactions on Industrial Informatics, 2020, 16(5): 2946-2955.

Liang Ma, Jie Dong, Kaixiang Peng. A novel hierarchical detection and isolation framework for quality-related multiple faults in large-scale processes. IEEE Transactions on Industrial Electronics, 2020, 67(2): 1316-1327.