个人信息Personal Information
教师英文名称:Tony
职称:副教授
硕士生导师
毕业院校:北京科技大学
学科:计算机科学与技术
学历:研究生(博士)毕业
学位:工学博士学位
所在单位:北京科技大学
职务:Associate professor
电子邮箱:
Fast-FineCut: Grain boundary detection in microscopic images considering 3D information
点击次数:
DOI码:10.1016/j.micron.2018.09.002
发表刊物:Micron
摘要:The inner structure of a material is called its microstructure. It stores the genesis of a material and determines all the physical and chemical properties. However, the microstructure is highly complex and numerous image defects such as vague or missing boundaries formed during sample preparation, which makes it difficult to extract the grain boundaries precisely. In this work, we address the task of grain boundary detection in microscopic image processing and develop a graph-cut based method called Fast-FineCut to solve the problem. Our algorithm makes two key contributions: (1) An improved approach that incorporates 3D information between slices as domain knowledge, which can detect the boundaries precisely, even for the vague and missing boundaries. (2) A local processing method based on overlap-tile strategy, which can not only solve the “chain scission” problem at the edge of images, but also economize on the consumption of computing resources. We conduct experiments on a stack of 296 slices of microscopic images of polycrystalline iron (1600 × 2800) and compare the performance against several state-of-the-art boundary detection methods. We conclude that FastFineCut can detect boundaries effectively and efficiently.
合写作者:Xiaojuan Ban,Ya Su,Chuni Liu,Hao Wang,Weihua Xue,Yonghong Zhi,Di Wu
第一作者:Boyuan Ma
论文类型:期刊论文
学科门类:工学
文献类型:J
期号:116
页面范围:5-14
是否译文:否
发表时间:2019-01-01
收录刊物:SCI