Xinghua Zheng, Lin Qiu, Guoping Su, Dawei Tang, “Harmonic Micrometer/Nanometre Film Thermal Property Test Method” - C.N. Patent 201010218390.1, Awarded 2012/6/27. (Invention)
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Pre One:Xinghua Zheng, Lin Qiu, Guoping Su, Dawei Tang, “Method and Device for Testing Thermal Physical Property of Single Conductive Filamentary Material by Using Harmonic Method” - C.N. Patent 201010141035.9, Awarded 2012/10/31. (Invention)
Next One:Xinghua Zheng, Lin Qiu, Dawei Tang, “Method and Device for Testing Thermal Physical Property of Solid Material with Independent Probe by Using Harmonic Method” - C.N. Patent 200910242362.0, Awarded 2011/10/5. (Invention)
