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Xinghua Zheng, Lin Qiu, Dawei Tang, “Method and Device for Testing Thermal Physical Property of Solid Material with Independent Probe by Using Harmonic Method” - C.N. Patent 200910242362.0, Awarded 2011/10/5. (Invention)

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Pre One:Xinghua Zheng, Lin Qiu, Guoping Su, Dawei Tang, “Harmonic Micrometer/Nanometre Film Thermal Property Test Method” - C.N. Patent 201010218390.1, Awarded 2012/6/27. (Invention)

Next One:Xinghua Zheng, Peng Yue, Yuhua Li, Lin Qiu, Dawei Tang, “Spiral Pipe-type Non-phase-change Heating Device” - C.N. Patent 201410194345.5, Awarded 2017/8/25. (Invention)

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