Deep asymmetric metric learning via rich relationship mining
Date:2025-06-25 clicks:
Journal:Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
First Author:Xinyi Xu, et.al.
Indexed by:Article
Document Code:3
Discipline:Engineering
Document Type:C
Issue:4076-4085
Translation or Not:no
Date of Publication:2019-06-01
Included Journals:SCI、EI