Towards Improved and Interpretable Deep Metric Learning via Attentive Grouping
Date:2025-06-25 clicks:
Journal:IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI)
Key Words:零样本学习，深度度量学习，细粒度检索
First Author:Xinyi Xu, et.al.
Indexed by:Journal paper
Document Code:1
Discipline:Engineering
Document Type:J
Volume:45
Issue:1
Page Number:1189-1200
ISSN No.:1939-3539
Translation or Not:no
Date of Publication:2023-01-01
Included Journals:SCI