北京科技大学主页平台管理系统吴桂林--中文主页-- Guilin Wu and S. Zaefferer. Advances in TEM Orientation Microscopy by combination of dark field conical scanning and improved image matching. Ultramicroscopy, 109 (2009): 1317-1325.

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吴桂林Wuguilin

研究员

博士生导师

学科：材料加工工程

学位：博士

所在单位：碳中和研究院、碳中和学院

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Guilin Wu and S. Zaefferer. Advances in TEM Orientation Microscopy by combination of dark field conical scanning and improved image matching. Ultramicroscopy, 109 (2009): 1317-1325.

发布时间：2022-04-14 点击次数：

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上一条：Guilin Wu and D Juul Jensen. Automatic Determination of Recrystallization Parameters Based on EBSD Mapping. Materials Characterization, 59 (2008): 794-800.

下一条：Guilin Wu, A. Godfrey, G. Winther, D. Juul Jensen and Q. Liu. Evolution of Orientations and Deformation Structures within Individual Grains in Cold Rolled Columnar-Grained Nickel. Acta Materialia, 59 (2011): 5451-5461.