Atomic-Scale Distribution and Evolution of Strain in Pt Nanoparticles Grown on MoS₂ Nanosheet

Date:2026-11-07 clicks:

Impact Factor:8.7

DOI number:10.1002/smtd.202400179

Affiliation of Author(s):北京科技大学

Journal:Small Methods

Place of Publication:德国

Abstract:Interface strain significantly affects the band structure and electronic states of metal-nanocrystal-2D-semiconductor heterostructures, impacting system performance. While transmission electron microscopy (TEM) is a powerful tool for studying interface strain, its accuracy may be compromised by sample overlap in high-resolution images due to the unique nature of the metal-nanocrystals-2D-semiconductors heterostructure.

Co-author:Z. T. Zhao, Y. Y. Xu, R. M. Wang

First Author:Y. C. Zhu

Indexed by:Journal paper

Correspondence Author:Rongming Wang

Discipline:Engineering

Document Type:J

Volume:8

Issue:12

Page Number:2400179

ISSN No.:2366-9608/2366-9608

Translation or Not:no

Date of Publication:2024-12-01

Links to published journals:https://onlinelibrary.wiley.com/doi/10.1002/smtd.202400179

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