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张师平,吴平,闫丹,陈森,邱宏.利用阻抗分析仪测量薄膜材料的介电性质[J].实验技术与管理,2009,26(08):29-31+35

Release time:2022-04-08 Hits:

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Pre One:张师平,陈森,吴平.全息照相实验中光强的测量[J].金属世界,2011(04):29-30 Next One:吴平,张师平,闫丹,陈森.薄膜材料电容率的测量[J].物理实验,2009,29(02):1-3+16

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