北京科技大学主页平台管理系统陈冷--中文主页-- Xiaowen Peng, Leng Chen*. Effect of high entropy alloys TiVCrZrHf barrier layer on microstructure and texture of Cu thin films. Materials Letters, 2018,230:5-8

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Xiaowen Peng, Leng Chen*. Effect of high entropy alloys TiVCrZrHf barrier layer on microstructure and texture of Cu thin films. Materials Letters, 2018,230:5-8

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上一条：: Xiaowen Peng, Leng Chen*. Interdiffusion phenomena and magnetic properties of deposited Co/Cu/Co trilayers on silicon wafers. Science of Advanced Materials, 2018,10:1327-1331

下一条：: Qixun Yin, Leng Chen*. Microstructure and crystallization kinetics of Ge2Sb2Te5-Sn phase change materials. Journal of Materials Science: Materials in Electronics, 2018,29:16523-16533