北京科技大学主页平台管理系统李亚琼--中文主页-- Yaqiong Li, Damoah Lucas Nana Wiredu, Lifeng Zhang. Growth and characterization of silicon oxide films formed in the presence of Si, SiC, and Si3N4. Materials Science in Semiconductor Processing, 2016, 54: 20-28. (SCI/EI)

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个人信息

李亚琼Liyaqiong

副教授

硕士生导师

学科：有色金属冶金

所在单位：冶金与生态工程学院

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Yaqiong Li, Damoah Lucas Nana Wiredu, Lifeng Zhang. Growth and characterization of silicon oxide films formed in the presence of Si, SiC, and Si3N4. Materials Science in Semiconductor Processing, 2016, 54: 20-28. (SCI/EI)

发布时间：2022-04-05 点击次数：

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上一条：Yaqiong Li, Yi Tan, Panpan Cao, Jiayan Li, Pengjun Jia, Yao Liu. Study on redistribution of boron during silicon solidification refining process in Si-Al melts. Materials Research Innovations, 2015, 19 (2): 81-85. (SCI/EI)

下一条：Yaqiong Li, Yi Tan, Jiayan Li, Qiang Xu, Yao Liu. Effect of Sn content on microstructure and boron distribution in Si-Al alloy. Journal of Alloys and Compounds, 2014, 583: 85-90. (SCI/EI)