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Lin Qiu, Xinghua Zheng, Xianfeng Xu, Lanlan Li, Dawei Tang, “Device and Method of Testing Material Thermophysical Property Parameter” - C.N. Patent 201310032893.3, Awarded 2016/2/24. (Invention)

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Pre One:Lin Qiu, Xinghua Zheng, Daqing Li, Dawei Tang, “Device for Testing Thermophysical Parameters of Material by Double-helix Plane Structure Harmonic Wave Method” - C.N. Patent 201410078886.1, Awarded 2016/6/1. (Invention)

Next One:Lin Qiu, Xianfeng Xu, Dawei Tang, Jie Zhu, Wenfeng Bu, “Optical System and Method for Measuring Thermal Physical Property Parameters of Solid” - C.N. Patent 201210476747.5, Awarded 2014/8/20. (Invention)

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