Xiao H F, Chen D, Guo S F, Xu J W. Defects identification using the improved ultrasonic measurement model and support vector machines. NDT & E International, 2020, 111: 102223
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Xiao H F, Chen D, Guo S F, Xu J W. Defects identification using the improved ultrasonic measurement model and support vector machines. NDT & E International, 2020, 111: 102223
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